Preparation and characterization of single-atom tips

Nano Letters

Volumn 4, Issue 12, 2004, Pages 2379-2382

  Kuo, Hong Shi ^a   Hwang, Ing Shouh ^a   Fu, Tsu Yi ^b   Wu, Jun Yi ^b   Chang, Che Cheng ^a   Tsong, Tien T ^a  

^a INSTITUTE OF PHYSICS   (Taiwan)

^b NATIONAL TAIWAN NORMAL UNIVERSITY   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; ELECTRON MICROSCOPY; ELECTROPLATING; EVAPORATION; PALLADIUM; PLATINUM; THERMODYNAMICS; ULTRAHIGH VACUUM;

CATHODIC CLEANING; FIELD EMISSION SPECTROSCOPY; SINGLE-ATOM TIPS;

SINGLE CRYSTALS;

EID: 10844227531     PISSN: 15306984     EISSN: None     Source Type: Journal    
DOI: 10.1021/nl048569b     Document Type: Article

References (37)

1. Garcia, N.; Rohrer, H. J. Phys.: Condens. Matter 1989, 1, 3737.
2. Binning, G.; Rohrer, H.; Gerber, Ch.; Weibel, E. Phys. Rev. Lett. 1982, 49, 57.
3. Fink, H. W. IBM. J. Res. Dev. 1986, 30, 460.
4. Fink, H. W. Phys. Scripta 1988, 38, 260.
5. Binh, V. T.; Purcell, S. T.; Garcia, N.; Doglioni, J. Phys. Rev. Lett. 1992, 69, 2527.
6. Binh, V. T.; Garcia, N. Ultramicroscopy 1992, 42-44, 80.
7. Nagaoka, K.; Fujii, H.; Matsuda, K.; Komaki, M.; Murata, Y.; Oshima, C.; Sakurai, T. Appl. Surf. Sci. 2001, 182, 12.
8. Song, K. J.; Demmin, R. A.; Dong, C.; Garfunkel, E.; Madey, T. E. Surf. Sci. Lett. 1990, 227, L79.
9. Song, K. J.; Dong, C. Z.; Madey, T. E. Langmuir 1991, 7, 3019.
10. Madey, T. E.; Guan, J.; Nien, C. H.; Dong, C. Z.; Tao, H. S.; Campbell, R. A. Surf. Rev. Lett. 1996, 3, 1315.
11. Madey, T. E.; Nien, C. H.; Pelhos, K.; Kolodziej, J. J.; Abdelrehim, I. M.; Tao, H. S. Surf. Sci. 1999, 438, 191.
12. Chen, S. P. Surf. Sci. Lett. 1992, 274, L619.
13. Che, J. G.; Chan, C. T.; Kuo, C. H.; Leung, T. C. Phys. Rev. Lett. 1997, 79, 4230.
14. Fu, T. Y.; Cheng, L. C.; Nien, C. H.; Tsong, T. T. Phys. Rev. B 2001, 64, 113401.
15. Tsong, T. T. In Atom-Probe Field Ion Microscopy; Cambridge University Press: Cambridge, 1990.
16. Macdonald, D. D.; Sikora, E.; Sikora, J. Electrochim. Acta 1998, 43, 2851.
17. 2 (Synthesis)) are used to avoid the inclusion of impurity ions.
18. The under potential deposition (upd) technique, which is widely used to deposit one monolayer of metal in electrolyte, cannot be adopted here because the work functions of the depositing metals (Pd or Pt) are higher than that of W.
19. Szczepkowicz, A.; Ciszewski, A. Surf. Sci. 2002, 515, 441.
20. Pelhos, K.; Hannon, J. B.; Kellogg, G. L.; Madey, T. E. Surf. Sci. 1999, 432, 115.
21. Atlan, D.; Gardet, G.; Binh, V. T.; Garcia, N.; Saenz, J. J. Ultramicroscopy 1992, 42-44, 154.
22. Duke, C. B.; Alferieff, M. E. J. Chem. Phys. 1967, 46, 923.
23. Reduced brightness (B,) is independent of the accelerating voltage and can be regarded as an intrinsic quantity of the electron gun performance, It is defined as BΓ = B/V, where B is brightness and V is the accelerating voltage.
24. Shimoyama, H.; Maruse, S. Ultramicroscopy 1984, 15, 239.
25. Someya, T.; Goto, T.; Harada, Y.; Yamada, K.; Koike, H.; Kokubo, Y.; Watanabe, M. Optik 1974, 41, 225.
26. Young, R. D. Phys. Rev. 1959, 113, 110.
27. Swanson, L. W.; Crouser, L. C. J. Appl. Phys. 1969, 40, 4741.
28. Qian, W.; Scheinfein, M. R.; Spence, J. C. H. Appl. Phys. Lett. 1993, 62, 315.
29. Jonge, N. d.; Lamy, Y.; Schoots, K.; Oosterkamp T. H. Nature 2002, 420, 393.
30. Dean, K. A.; Chalamala, B. R. J. Appl. Phys. 1999, 85, 3832.
31. Oshima, C.; Mastuda, K.; Kona, T.; Mogami, Y.; Komaki, M.; Murata, Y.; Yamashita, T. Phys. Rev. Lett. 2002, 88, 038301.
32. Liang, S. D.; Huang, N. Y.; Deng, S. Z.; Xu, N. S. Appl. Phys. Lett. 2004, 85, 813.
33. Jonge, N. d.; Allioux, M.; Doytcheva, M.; Kaiser, M.; Teo, K. B. K.; Lacerda, R. G.; Milne, W. I. Appl. Phys. Lett. 2004, 85, 1607.
34. Zuo, J. M.; Vartanyants, I.; Gao, M.; Zhang, R.; Nagahara, L. A. Science 2003, 300, 1419.
35. Gabor, D. Nature 1948, 161, 777.
36. Fink, H. W.; Stocker, W.; Schimid, H. Phys. Rev. Lett. 1990, 65, 1204.
37. Tonomura, A. In Electron holography; Springer: Berlin, 1999.