Diagram Method for Exact Solution of the Problem of Scanning Near-Field Microscopy

Optics and Spectroscopy (English translation of Optika i Spektroskopiya)

Volumn 90, Issue 3, 2001, Pages 416-425

  Bozhevolnyi, S I ^a   Lozovski, V Z ^b   Nazarok, Yu V ^b  

^a AALBORG UNIVERSITY   (Denmark)

^b INSTITUTE OF SEMICONDUCTOR PHYSICS   (Ukraine)

Author keywords

[No Author keywords available]

Indexed keywords

IMAGE ANALYSIS; NANOSTRUCTURED MATERIALS; NEAR FIELD SCANNING OPTICAL MICROSCOPY; QUANTUM OPTICS;

EXACT SOLUTION;

PHYSICAL OPTICS;

EID: 0000053114     PISSN: 0030400X     EISSN: None     Source Type: Journal    
DOI: 10.1134/1.1358453     Document Type: Article

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