Energy dissipation and dynamic response of an amplitude-modulation atomic-force microscopy subjected to a tip-sample viscous force

Ultramicroscopy

Volumn 107, Issue 2-3, 2007, Pages 245-253

  Lin, Shueei Muh ^a  

^a KUN SHAN UNIVERSITY   (Taiwan)

Author keywords

AFM; AM; Energy dissipation

Indexed keywords

ATOMIC FORCE MICROSCOPY; COMPUTER SIMULATION; DAMPING; DYNAMIC RESPONSE; ENERGY DISSIPATION; VISCOSITY;

DAMPING RATIO; RESONANT QUALITY FACTORS; VISCOUS FORCE;

AMPLITUDE MODULATION;

ACCURACY; ANALYTICAL ERROR; ARTICLE; ATOMIC FORCE MICROSCOPY; DYNAMICS; ENERGY; ENERGY TRANSFER; FORCE; MATHEMATICAL MODEL; MEASUREMENT; THEORETICAL STUDY; TOPOGRAPHY;

MICROSCOPY, ATOMIC FORCE; VISCOSITY;

EID: 33845603126     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ultramic.2006.08.001     Document Type: Article

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