|
Volumn 106, Issue 6, 2006, Pages 516-524
|
Energy dissipation and frequency shift of a damped dynamic force microscopy
|
Author keywords
AFM; Damping; Frequency shift; Q factor
|
Indexed keywords
ATOMIC FORCE MICROSCOPY;
DAMPING;
ELASTIC MODULI;
FREQUENCY MODULATION;
Q FACTOR MEASUREMENT;
VISCOELASTICITY;
DYNAMIC FORCE MICROSCOPY;
FREQUENCY SHIFT;
TRANSIENT RESPONSE;
V-TYPED PROBE;
ENERGY DISSIPATION;
ARTICLE;
ATOMIC FORCE MICROSCOPY;
DYNAMICS;
ENERGY;
FORCE;
FREQUENCY MODULATION;
MICROSCOPY;
VISCOELASTICITY;
YOUNG MODULUS;
|
EID: 33646060375
PISSN: 03043991
EISSN: None
Source Type: Journal
DOI: 10.1016/j.ultramic.2006.01.004 Document Type: Article |
Times cited : (10)
|
References (23)
|