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Volumn 157, Issue 4, 2000, Pages 361-366

Frequency shift and energy dissipation in non-contact atomic-force microscopy

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL ORIENTATION; ENERGY DISSIPATION; SILICON;

EID: 0033742953     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(99)00551-6     Document Type: Article
Times cited : (12)

References (19)
  • 15
    • 0343277935 scopus 로고    scopus 로고
    • Defects in electronic materials II
    • J. et al. Michel. Pittsburgh: Materials Research Society
    • Sugawara Y. Defects in electronic materials II. Michel J.et al. MRS Symposia Proceedings No 442. 1996;16-23 Materials Research Society, Pittsburgh.
    • (1996) MRS Symposia Proceedings No 442 , pp. 16-23
    • Sugawara, Y.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.