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Volumn 157, Issue 4, 2000, Pages 361-366
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Frequency shift and energy dissipation in non-contact atomic-force microscopy
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Author keywords
[No Author keywords available]
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Indexed keywords
CRYSTAL ORIENTATION;
ENERGY DISSIPATION;
SILICON;
NONCONTACT ATOMIC FORCE MICROSCOPY;
ATOMIC FORCE MICROSCOPY;
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EID: 0033742953
PISSN: 01694332
EISSN: None
Source Type: Journal
DOI: 10.1016/S0169-4332(99)00551-6 Document Type: Article |
Times cited : (12)
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References (19)
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