Exact solution of the frequency shift in dynamic force microscopy

Applied Surface Science

Volumn 250, Issue 1-4, 2005, Pages 228-237

  Lin, Shueei Muh ^a  

^a KUN SHAN UNIVERSITY   (Taiwan)

Author keywords

AFM; Frequency shift; Non contact mode

Indexed keywords

IMAGING TECHNIQUES; NATURAL FREQUENCIES; OSCILLATIONS; PERTURBATION TECHNIQUES; PIEZOELECTRIC MATERIALS; SURFACE TREATMENT;

FREQUENCY SHIFT; FREQUENCY SHIFT MODE (FSM); NON-CONTACT MODE; POINCARE'S METHOD;

ATOMIC FORCE MICROSCOPY;

EID: 23844554220     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2005.01.003     Document Type: Article

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