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Volumn 81, Issue 5, 2007, Pages 686-694

Microwave dielectric behavior of nanocrystalline titanium dioxide thin films

Author keywords

Microwave dielectric properties; Sputtering; Thin films; X ray diffraction

Indexed keywords

NANOSTRUCTURED MATERIALS; PERMITTIVITY; PERTURBATION TECHNIQUES; REFRACTIVE INDEX; SPUTTERING; X RAY DIFFRACTION ANALYSIS;

EID: 33845219909     PISSN: 0042207X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.vacuum.2006.04.005     Document Type: Article
Times cited : (19)

References (54)
  • 5
    • 33845202509 scopus 로고    scopus 로고
    • Pulker HK. Amsterdam: Elsevier Science Publishers B.V; 1984.
  • 34
    • 33845202023 scopus 로고    scopus 로고
    • Sudheendran K, Pam D, James Raju UKC, Ghanashyam Krishna M, Bhatnagar AK. Proceedings of APMC, Delhi, India, 2004. p. 421.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.