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Volumn 2005, Issue , 2005, Pages 511-518

Statistical technology mapping for parametric yield

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; BENCHMARKING; CONFORMAL MAPPING; CONSTRAINT THEORY; LEAKAGE CURRENTS; THRESHOLD VOLTAGE; TRANSISTORS;

EID: 33751404863     PISSN: 10923152     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ICCAD.2005.1560121     Document Type: Conference Paper
Times cited : (5)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.