Statistical technology mapping for parametric yield

IEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers, ICCAD

Volumn 2005, Issue , 2005, Pages 511-518

  Singh, Ashish Kumar ^a   Mani, Murari ^a   Orshansky, Michael ^a  

^a The University of Texas at Austin   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; BENCHMARKING; CONFORMAL MAPPING; CONSTRAINT THEORY; LEAKAGE CURRENTS; THRESHOLD VOLTAGE; TRANSISTORS;

LEAKAGE POWER CONSTRAINTS; MAPPING ALGORITHM; PARAMETRIC YIELD; TRANSISTOR CHANNEL LENGTH;

COMPUTER AIDED DESIGN;

EID: 33751404863     PISSN: 10923152     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ICCAD.2005.1560121     Document Type: Conference Paper

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