Non-ideal behavior in a model system: Contact degradation in a molecularly doped polymer revealed by variable-temperature electric force microscopy

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 6336, Issue , 2006, Pages

  Ng, Tse Nga ^b   Silveira, William R ^c   Marohn, John A ^a  

^a Cornell University ^*  (United States)

^b PALO ALTO RESEARCH CENTER   (United States)

^c HARVARD MEDICAL SCHOOL   (United States)

Author keywords

AFM; Crystallization; Degradation; Diffusion; EFM; Injection; OLED; TPD; Trapping; Triarylamine

Indexed keywords

ELECTRIC FORCE MICROSCOPE; GOLD ELECTRODES; HOLE TRANSPORTING LAYER; MOLECULARLY DOPED POLYMER;

DEGRADATION; ELECTRON MOBILITY; ELECTRON TRANSPORT PROPERTIES; LIGHT EMITTING DIODES; MOLECULAR DYNAMICS; POLYSTYRENES;

POLYMERS;

EID: 33751398248     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.681010     Document Type: Conference Paper

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