Degradation mechanisms in organic light emitting diodes

Synthetic Metals

Volumn 111, Issue , 2000, Pages 233-236

  Shen, J ^a   Wang, D ^a   Langlois, E ^a   Barrow, W A ^b   Green, P J ^b   Tang, C W ^c   Shi, J ^c  

^a ARIZONA STATE UNIVERSITY   (United States)

^b Planar Systems   (United States)

^c EASTMAN KODAK COMPANY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DEGRADATION; ELECTRIC POTENTIAL; ELECTROLUMINESCENCE; MATHEMATICAL MODELS; NUMERICAL METHODS; OPTICAL VARIABLES MEASUREMENT; RELIABILITY;

DRIVE VOLTAGE; MOBILE ION TRANSIENT EQUATIONS; MOBILE IONS; ORGANIC LIGHT EMITTING DIODES;

LIGHT EMITTING DIODES;

EID: 0033722887     PISSN: 03796779     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0379-6779(99)00370-7     Document Type: Article

References (8)

1. Zou D., Yahiro M., Tsutui T. Jpn. J. Appl. Phys. 37:1998;L1406.
2. Aziz H., Popovic Z.D., Hu N.-X., Hor A.-M., Xu G. Science. 283:1999;1900.
3. Lane P.A., Giebeler C., Whitelegg S.A., Campbell A.J., Martin S.J., Bradley D.D.C. 1999 Centennial Meeting Bulletin of the American Physical Society. Vol. 44:1999;647. No. 1.
4. Pierret R.F. Semiconductor Device Fundamentals. 1996;650-673 Addison-Wesley, MA.
5. Smith J.M. Chemical Engineering Kinetics. 3rd edn:1981;279-280 McGraw-Hill, New York.
6. Wolf S., Tauber R.N. Silicon Processing for the VLSI ERA. Vol. 1:1986;246 Lattice.
7. Greeuw G., Verwey J.F. J. Appl. Phys. 58:1984;2218.
8. deMello J.C., Tessler N., Graham S.C., Friend R.H. Phys. Rev. B. 57:1998;12951.