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Journal of Applied Physics

Volumn 96, Issue 1, 2004, Pages 641-644

Nanoscale observation of failures in organic light-emitting diodes

(5) Czerw, R a Carroll, D L a Woo, H S b Kim, Y B b Park, J W c

a CLEMSON UNIVERSITY (United States)

b Korea Institute of Science and Technology (South Korea)

c The Catholic University of Korea (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON TRANSPORT LAYERS (ETL); EMISSIVE LAYERS (EML); ORGANIC LIGHT-EMITING DIODES (OLED); VIDEO MONITORS;

CATHODES; COMPUTER MONITORS; COSTS; DOPING (ADDITIVES); ELECTROLUMINESCENCE; INTERFACES (MATERIALS); MATHEMATICAL MODELS; SILICON WAFERS; SPECTROMETERS;

LIGHT EMITTING DIODES;

EID: 3142761979 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.1759398 Document Type: Article

Times cited : (20)

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