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Volumn 69, Issue 19, 1996, Pages 2894-2896
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Failure phenomena and mechanisms of polymeric light-emitting diodes: Indium-tin-oxide damage
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Author keywords
[No Author keywords available]
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Indexed keywords
CURRENT VOLTAGE CHARACTERISTICS;
DECOMPOSITION;
ELECTRIC FIELDS;
ELECTRIC RESISTANCE;
FAILURE ANALYSIS;
GLASS;
LIGHT EMISSION;
MORPHOLOGY;
OXIDES;
POLYMERS;
SURFACES;
THIN FILMS;
DAMAGE PHENOMENON;
HOLE TRANSPORT LAYER;
INDIUM TIN OXIDE;
SELF DECOMPOSITION;
LIGHT EMITTING DIODES;
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EID: 0030569179
PISSN: 00036951
EISSN: None
Source Type: Journal
DOI: 10.1063/1.117354 Document Type: Article |
Times cited : (78)
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References (16)
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