메뉴 건너뛰기




Volumn 69, Issue 19, 1996, Pages 2894-2896

Failure phenomena and mechanisms of polymeric light-emitting diodes: Indium-tin-oxide damage

Author keywords

[No Author keywords available]

Indexed keywords

CURRENT VOLTAGE CHARACTERISTICS; DECOMPOSITION; ELECTRIC FIELDS; ELECTRIC RESISTANCE; FAILURE ANALYSIS; GLASS; LIGHT EMISSION; MORPHOLOGY; OXIDES; POLYMERS; SURFACES; THIN FILMS;

EID: 0030569179     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.117354     Document Type: Article
Times cited : (78)

References (16)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.