Recoverable degradation phenomena of quantum efficiency in organic EL devices

Synthetic Metals

Volumn 111, Issue , 2000, Pages 245-247

  Yahiro, Masayuki ^a   Zou, Dechun ^a   Tsutsui, Tetsuo ^a  

^a KYUSHU UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CURRENT DENSITY; DEGRADATION; ELECTRIC FIELDS; ELECTRIC POTENTIAL; QUANTUM EFFICIENCY; SHORT CIRCUIT CURRENTS; SUBLIMATION; VACUUM APPLICATIONS;

INTERNAL ELECTRIC FIELD MODEL; REVERSE BIAS INDUCED RECOVERY; SPONTANEOUS RECOVERY; VACUUM SUBLIMATION;

LUMINESCENT DEVICES;

EID: 0033701055     PISSN: 03796779     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0379-6779(99)00373-2     Document Type: Article

References (6)

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3. Zou D., Yahiro M., Tsutsui T. Appl. Phys. Lett. 72:1998;2484.
4. Tsutsui T., Saito S. Aldissi M. Intrinsically Conducting Polymer: An Emerging Technology. 1993;123 Kluwer Academic Publishing, Netherlands.
5. Tsutsui T. MRS Bull. 22:1997;39.
6. Cao Y., Parker I.D., Yu G., Zhang C., Heeger A.J. Nature. 397:1999;414.