Direct evaluation of contact injection efficiency into small molecule based transport layers: Influence of extrinsic factors

Journal of Applied Physics

Volumn 83, Issue 5, 1998, Pages 2670-2676

  Abkowitz, M ^a,b   Facci, J S ^a,b   Rehm, J ^b,c  

^a XEROX CORPORATION   (United States)

^b UNIVERSITY OF ROCHESTER   (United States)

^c BATTELLE MEMORIAL INSTITUTE   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001070884     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.367030     Document Type: Review

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