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Volumn 2005, Issue , 2005, Pages 1876-1881

Overview of oversampling clock and data recovery circuits

Author keywords

CDR; DR; Jitter tolerance; Oversampling; PLL

Indexed keywords

EYE TRACKING ARCHITECTURE; JITTER TOLERANCE; MULTIPLE ROTATING PHASES; NON RETURN TO ZERO (NRZ);

EID: 33751314584     PISSN: 08407789     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/CCECE.2005.1557348     Document Type: Conference Paper
Times cited : (15)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.