Structural study of TiO2 thin films by micro-Raman spectroscopy

Central European Journal of Physics

Volumn 4, Issue 1, 2006, Pages 105-116

  Niilisk, Ahti ^a   Moppel, Mart ^a   Pärs, Martti ^a   Sildos, Ilmo ^a   Jantson, Taavi ^a   Avarmaa, Tea ^a   Jaaniso, Raivo ^a   Aarik, Jaan ^a  

^a UNIVERSITY OF TARTU   (Estonia)

Author keywords

Atomic layer deposition; Pulsed laser deposition; Raman spectroscopy; Thin films; Titanium dioxide

Indexed keywords

EID: 33751011355     PISSN: 18951082     EISSN: 16443608     Source Type: Journal    
DOI: 10.1007/s11534-005-0009-3     Document Type: Article

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