Growth and characterization of TiO2 as a barrier for spin-polarized tunneling

Applied Physics Letters

Volumn 82, Issue 19, 2003, Pages 3269-3271

  Bibes, M ^a   Bowen, M ^a   Barthelemy A ^a   Anane, A ^a   Bouzehouane, K ^a   Carretero C ^a   Jacquet, E ^a   Contour, J P ^a   Durand, O ^b  

^a CNRS   (France)

^b THALES RESEARCH AND TECHNOLOGY   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRONIC STRUCTURE; EPITAXIAL GROWTH; INTERFACES (MATERIALS); LOW TEMPERATURE EFFECTS; MAGNETORESISTANCE; PEROVSKITE; POLARIZATION; TUNNEL JUNCTIONS; X RAY DIFFRACTION ANALYSIS;

SPIN POLARIZATION;

TITANIUM DIOXIDE;

EID: 0037643320     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1568159     Document Type: Article

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