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Volumn 36, Issue 1-3, 1996, Pages 381-383
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Preparation and micro-structural characterization of nanosized thin film of TiO2-WO3 as a novel material with high sensitivity towards NO2
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Author keywords
Nanosized thin film of TiO2 WO3; Sensitivity; NO2
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Indexed keywords
ANNEALING;
CRYSTAL MICROSTRUCTURE;
ELECTRON MICROSCOPY;
MORPHOLOGY;
NANOSTRUCTURED MATERIALS;
NITROGEN COMPOUNDS;
POLYCRYSTALLINE MATERIALS;
RAMAN SPECTROSCOPY;
SPUTTER DEPOSITION;
TITANIUM COMPOUNDS;
TUNGSTEN COMPOUNDS;
X RAY DIFFRACTION ANALYSIS;
NANOSIZED THIN FILM;
POLYCRYSTALLINE THIN FILM;
THIN FILMS;
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EID: 0030257215
PISSN: 09254005
EISSN: None
Source Type: Journal
DOI: 10.1016/S0925-4005(97)80100-1 Document Type: Article |
Times cited : (62)
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References (5)
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