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Volumn 242, Issue 1-2, 2002, Pages 189-198

Atomic layer growth of epitaxial TiO2 thin films from TiCl4 and H2O on α-Al2O3 substrates

Author keywords

A1. Surface structure; A3. Atomic layer deposition; B1. Titanium dioxide; B2. Optical properties

Indexed keywords

AMORPHOUS SILICON; ENERGY GAP; FILM GROWTH; REFRACTIVE INDEX; SILICA; SUBSTRATES; THIN FILMS; TITANIUM DIOXIDE;

EID: 0036643744     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-0248(02)01426-4     Document Type: Article
Times cited : (85)

References (23)
  • 16
    • 0009407217 scopus 로고    scopus 로고
    • JCPDS-International Centre for Diffaction Data, PDF 21-1272
  • 17
    • 0009400179 scopus 로고    scopus 로고
    • JCPDS-International Centre for Diffaction Data, PDF 21-1276


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.