Mechanism of GaN quantum dots capped with AlN: An AFM, electron microscopy, and x-ray anomalous diffraction study

Physical Review B - Condensed Matter and Materials Physics

Volumn 74, Issue 19, 2006, Pages

  Coraux, J ^a   Amstatt, B ^a   Budagoski, J A ^a,c   Bellet Amalric, E ^a   Rouvière, Jean Luc ^a   Favre Nicolin, V ^a   Proietti, M G ^b   Renevier, H ^a   Daudin, B ^a  

^a CEA GRENOBLE   (France)

^b UNIVERSITY OF ZARAGOZA   (Spain)

^c UNIVERSITY OF VALENCIA   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 33750593328     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.74.195302     Document Type: Article

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