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Applied Physics A: Materials Science and Processing

Volumn 85, Issue 3, 2006, Pages 227-231

Applications of electron microscopy to the characterization of semiconductor nanowires

(5) Tham, D a Nam, C Y a Byon, K a Kim, J a Fischer, J E a

a UNIVERSITY OF PENNSYLVANIA (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ASSEMBLY; CRYSTAL DEFECTS; CRYSTAL GROWTH; MORPHOLOGY; SEMICONDUCTOR MATERIALS; TRANSMISSION ELECTRON MICROSCOPY;

CURRENT PROGRESS; NANOWIRE GROWTH; SEMICONDUCTOR NANOWIRES; VAPOR-LIQUID-SOLID (VLS);

NANOSTRUCTURED MATERIALS;

EID: 33750172383 PISSN: 09478396 EISSN: 14320630 Source Type: Journal
DOI: 10.1007/s00339-006-3705-y Document Type: Article

Times cited : (5)

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