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Advanced Materials

Volumn 18, Issue 3, 2006, Pages 290-294

Microstructure and composition of focused-ion-beam-deposited Pt contacts to GaN nanowires

(3) Tham, Douglas a Nam, Chang Yong a Fischer, John E a

a UNIVERSITY OF PENNSYLVANIA (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CARBON; COMPOSITION; GALLIUM NITRIDE; MICROSTRUCTURE; NANOSTRUCTURED MATERIALS; PLATINUM;

ELECTRICAL PERFORMANCE; NANOWIRES;

ION BEAM ASSISTED DEPOSITION;

EID: 32244440456 PISSN: 09359648 EISSN: None Source Type: Journal
DOI: 10.1002/adma.200501832 Document Type: Article

Times cited : (65)

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