Localized electrochemical oxidation of p-GaAs(100) using atomic force microscopy with a carbon nanotube probe

Nanotechnology

Volumn 17, Issue 15, 2006, Pages 3838-3843

  Huang, Wu Ping ^a   Cheng, Hung Hsiang ^a   Jian, Sheng Rui ^b   Chuu, Der San ^b   Hsieh, Jin Yuan ^c   Lin, Chih Ming ^d   Chiang, Mu Sheng ^e  

^a NATIONAL TAIWAN UNIVERSITY   (Taiwan)

^b NATIONAL CHIAO TUNG UNIVERSITY   (Taiwan)

^c MINGHSIN UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Taiwan)

^d NATIONAL TSING HUA UNIVERSITY   (Taiwan)

^e NAN KAI UNIVERSITY OF TECHNOLOGY   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; AUGER ELECTRON SPECTROSCOPY; CARBON NANOTUBES; ELECTRIC POTENTIAL; ELECTROCHEMISTRY; NANOSTRUCTURED MATERIALS; OXIDATION;

ANODIZING VOLTAGES; ELECTROCHEMICAL NANOLITHOGRAPHY; MULTIWALLED CARBON NANOTUBE (MWCNT); P-GAAS(100);

PHOSPHORUS COMPOUNDS;

EID: 33748902625     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/17/15/039     Document Type: Article

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