Scanning probe microscope tip-induced oxidation of GaAs using modulated tip bias

Journal of Applied Physics

Volumn 87, Issue 12, 2000, Pages 8754-8758

  Okada, Yoshitaka ^a   Luchi, Yoshimasa ^a   Kawabe, Mitsuo ^a  

^a UNIVERSITY OF TSUKUBA   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001419860     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.373606     Document Type: Article

References (14)

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