Basic properties of GaAs oxide generated by scanning probe microscope tip-induced nano-oxidation process

Journal of Applied Physics

Volumn 88, Issue 2, 2000, Pages 1136-1140

  Okada, Yoshitaka ^a   Iuchi, Yoshimasa ^a   Kawabe, Mitsuo ^a   Harris Jr , James S ^b  

^a UNIVERSITY OF TSUKUBA   (Japan)

^b Stanford University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001092847     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.373788     Document Type: Article

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