Deployment of Better Than Worst-Case Design: Solutions and needs

Proceedings - IEEE International Conference on Computer Design: VLSI in Computers and Processors

Volumn 2005, Issue , 2005, Pages 550-555

  Austin, Todd ^a   Bertacco, Valeria ^a  

^a UNIVERSITY OF MICHIGAN   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DIGITAL SIGNAL PROCESSORS; RELIABILITY BUDGETS; RELIABLE CHECKER MECHANISMS; SILICON FABRICATION;

DIGITAL SIGNAL PROCESSING; MICROPROCESSOR CHIPS; NANOTECHNOLOGY; PROBLEM SOLVING; PRODUCT DESIGN; PROGRAM PROCESSORS;

COMPUTER ARCHITECTURE;

EID: 33748571467     PISSN: 10636404     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ICCD.2005.43     Document Type: Conference Paper

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