SPICE models for flicker noise in nMOSFETs from subthreshold to strong inversion

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Volumn 19, Issue 11, 2000, Pages 12931303-

  Xie, Dingming ^a   Cheng, Mengzhang ^a   Forbes, Leonard ^a  

^a Oregon State University   (United States)

Author keywords

BSIM 3.3; Drain current noise; HSPICE; I noise; Inputreferred noise; Measurement; NMOSFET; PSPICE; Saturation; Simulation; Subthreshold

Indexed keywords

EID: 33747502142     PISSN: 02780070     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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