Concurrent testing of digital microfluidics-based biochips

ACM Transactions on Design Automation of Electronic Systems

Volumn 11, Issue 2, 2006, Pages 442-464

  Su, Fei ^a,b   Ozev, Sule ^a,b   Chakrabarty, Krishnendu ^a,b  

^a DUKE UNIVERSITY   (United States)

^b Duke University   (United States)

Author keywords

Biochips; Catastrophic faults; Concurrent testing; Microfluidics

Indexed keywords

EID: 33746104081     PISSN: 10844309     EISSN: 10844309     Source Type: Journal    
DOI: 10.1145/1142155.1142164     Document Type: Article

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