Testable design and testing of micro-electro-fluidic arrays

Proceedings of the IEEE VLSI Test Symposium

Volumn 2003-January, Issue , 2003, Pages 403-409

  Kerkhoff, H G ^a   Acar, M ^a  

^a UNIVERSITY OF TWENTE   (Netherlands)

Author keywords

Chemical analysis; Circuit faults; Control system synthesis; Electrical fault detection; Electronic equipment testing; Fluid flow control; Manufacturing; Silicon; Software testing; Voltage

Indexed keywords

CHEMICAL ANALYSIS; CHEMICAL DETECTION; CHEMICAL EQUIPMENT; CONTROL SYSTEM SYNTHESIS; ELECTRIC FAULT LOCATION; ELECTRIC MACHINE CONTROL; ELECTRIC POTENTIAL; ELECTRONIC EQUIPMENT; ELECTRONIC EQUIPMENT TESTING; EQUIPMENT TESTING; FAULT DETECTION; FLOW OF FLUIDS; LEAKAGE (FLUID); MANUFACTURE; OSCILLATORS (ELECTRONIC); SILICON;

CIRCUIT FAULTS; ELECTRICAL FAULT DETECTIONS; ELECTRICAL PARTS; FAULT SIMULATION; FLUID VELOCITIES; FLUIDIC INTERFACE; INTERFACE ELECTRONICS; TESTABLE DESIGN;

SOFTWARE TESTING;

EID: 84943520669     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/VTEST.2003.1197681     Document Type: Conference Paper

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