Extending fault-based testing to microelectromechanical systems

Journal of Electronic Testing: Theory and Applications (JETTA)

Volumn 16, Issue 3, 2000, Pages 279-288

  Mir, Salvador ^a,b   Charlot, Benoît ^a   Courtois, Bernard ^a,c  

^a TIMA LABORATORY   (France)

^b INSTITUTO DE MICROELECTRÓNICA DE SEVILLA   (Spain)

^c Ecl Natl Sup d'Info M   (France)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER HARDWARE DESCRIPTION LANGUAGES; COMPUTER SIMULATION; COST EFFECTIVENESS; INTEGRATED CIRCUIT TESTING; MICROELECTROMECHANICAL DEVICES; MICROELECTRONICS; MICROMACHINING;

FAULT MODELING; FAULT SIMULATION; MICROELECTROMECHANICAL SYSTEMS; NODAL SIMULATION;

ELECTRONIC EQUIPMENT TESTING;

EID: 0033726368     PISSN: 09238174     EISSN: None     Source Type: Journal    
DOI: 10.1023/A:1008303717862     Document Type: Article

References (12)

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