MEMS built-in-self-test using MLS

Proceedings - Ninth IEEE European Test Symposium, ETS 2004

Volumn , Issue , 2004, Pages 66-71

  Dhayni, A ^a   Mir, S ^a   Rufer, L ^a  

^a TIMA LABORATORY   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRICAL TESTS; MAXIMUM LENGTH SEQUENCE (MLS); RANDOM TESTING; THERMAL BEHAVIOR;

CORRELATION METHODS; IMPULSE RESPONSE; MICROELECTROMECHANICAL DEVICES; MICROPROCESSOR CHIPS; PARAMETER ESTIMATION; SENSITIVITY ANALYSIS; SENSORS;

BUILT-IN SELF TEST;

EID: 15844407901     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ETSYM.2004.1347607     Document Type: Conference Paper

References (7)

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2. C. Y. Pan, and K. T. Cheng, "Pseudorandom testing for mixed-signals circuits", IEEE Trans, on Computer-Aided Design of Integrated Circuits and Systems, Vol. 16, No. 10, 1173-1185, 1997.
3. P. S.A. Evans, M. A. Al-Qutayri, and P. R.Shepherd, "A Novel Technique for Testing Mixed-Signal ICs", Proc. of the European Test Conference, April 1991, pp. 301-306.
4. F. Corsi, C. Marzocca, and G. Matarrese, "Defining a BIST-oriented signature for mixed-signal devices", In Proc.IEEE Southwest Symposium on Mixed-Signal Design, Las Vegas 22-26 February 2003 pp. 202-207.
5. L. Rufer, "La modélisation des microsystèmes électromécaniques", Chapter in Conception des microsystèmes sur silicium, S. Mir (Ed.), Paris, Ed. Hermes, Traité EGEM, 2002.
6. L. Rufer, S. Mir, E. Simeu, and C. Domingues, "On-chip pseudorandom MEMS testing", In 9th International Mixed-Signal Testing Workshop (IMSTW'03), Sevilla, Spain, June 25-27, 2003.
7. L. Rufer, C. Domingues and S. Mir, "Behavioral modeling and simulation of a MEMS-based ultrasonic pulse-echo system", In Proc. of the Design, Test, Integration and Packaging of MEMS/MOEMS, Cannes, France, May 2002, pp. 171-182.