Testing philosophy behind the micro analysis system

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3680, Issue I, 1999, Pages 78-83

  Kerkhoff, Hans G ^a  

^a UNIVERSITY OF TWENTE   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

BUILT-IN SELF TEST; CHARGE COUPLED DEVICES; COMPUTER AIDED DESIGN; DIGITAL SIGNAL PROCESSING; MICROACTUATORS; MICROSENSORS; MULTICHIP MODULES;

MICROANALYSIS SYSTEMS; MICROSYSTEM TESTING; MIXED SIGNAL TESTING; NONELECTRICAL TESTING;

MICROELECTROMECHANICAL DEVICES;

EID: 0032680120     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.341224     Document Type: Conference Paper

References (13)