Laser scanning microscopy of HTS films and devices

Fizika Nizkikh Temperatur (Kharkov)

Volumn 32, Issue 6, 2006, Pages 775-794

  Zhuravel, A P ^a   Sivakov, A G ^a   Turutanov, O G ^a   Omelyanchouk, A N ^a   Anlage, Steven M ^b   Lukashenko, A ^c   Ustinov, A V ^c   Abraimov, D ^d  

^a B VERKIN INSTITUTE FOR LOW TEMPERATURE PHYSICS AND ENGINEERING   (Ukraine)

^b Bldg 142   (United States)

^c UNIVERSITY OF ERLANGEN NUREMBERG   (Germany)

^d University of Wisconsin Madison   (United States)

Author keywords

Bolometric effect; High t c superconductivity; Laser scanning microscopy; Photoresponse; Spatially resolved imaging technique

Indexed keywords

BOLOMETERS; ELECTRIC CONDUCTIVITY; IMAGING TECHNIQUES; LASER BEAMS; SEMICONDUCTOR DEVICES; SINGLE CRYSTALS;

BOLOMETRIC EFFECT; HIGH-T C SUPERCONDUCTIVITY; LASER SCANNING MICROSCOPY; PHOTORESPONSE; SPATIALLY-RESOLVED IMAGING TECHNIQUE;

SEMICONDUCTING FILMS;

EID: 33745762242     PISSN: 01326414     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Review

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