Submicrometer electrical imaging of grain boundaries in high-Tc thin-film junctions by laser scanning microscopy

Physica C: Superconductivity and its Applications

Volumn 297, Issue 1-2, 1998, Pages 69-74

  Shadrin, P M ^a   Divin, Y Y ^a  

^a MIREA RUSSIAN TECHNOLOGICAL UNIVERSITY   (Russian Federation)

Author keywords

Electrical imaging; Grain boundaries; Josephson junctions; Thin films

Indexed keywords

BOLOMETERS; CRYSTAL SYMMETRY; GRAIN BOUNDARIES; HIGH TEMPERATURE SUPERCONDUCTORS; LASER BEAMS; OXIDE SUPERCONDUCTORS; SUBSTRATES; SUPERCONDUCTING FILMS; THERMAL EFFECTS; THERMOELECTRICITY; YTTRIUM COMPOUNDS;

BICRYSTALS; ELECTRICAL IMAGING; LASER SCANNING MICROSCOPY; YTTRIUM BARIUM COPPER OXIDE;

JOSEPHSON JUNCTION DEVICES;

EID: 0032025264     PISSN: 09214534     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-4534(97)01734-6     Document Type: Article

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