Imaging spatial variations in resistance along electrical conductors

Applied Physics Letters

Volumn 72, Issue 15, 1998, Pages 1920-1922

  Wen, Q ^a   Clarke, D R ^a  

^a University of California   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0345275272     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.121227     Document Type: Article

References (8)

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6. Q. Wen and D. R. Clarke, J. Appl. Phys. 83, 1132 (1998).
7. B. J. Root and T. Turner, 1985 International Reliability Physics Symposium (Institute of Electrical and Electronic Engineers, New York, 1985), pp. 100.
8. K. Luo, Z. Shi, J. Lai, and A. Majumdar, Appl. Phys. Lett. 68, 325 (1996.)