Influence of LaAlO3 surface topography on rf current distribution in superconducting microwave devices

Applied Physics Letters

Volumn 81, Issue 26, 2002, Pages 4979-4981

  Zhuravel, A P ^a   Ustinov, A V ^b   Harshavardhan, K S ^c   Anlage, Steven M ^d  

^a B VERKIN INSTITUTE FOR LOW TEMPERATURE PHYSICS AND ENGINEERING   (Ukraine)

^b UNIVERSITY OF ERLANGEN NUREMBERG   (Germany)

^c Neocera Inc   (United States)

^d Bldg 142   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CURRENT DENSITY; ETCHING; INTERMODULATION; LANTHANUM COMPOUNDS; LASER APPLICATIONS; MICROSCOPIC EXAMINATION; MICROWAVE FILTERS; RESONATORS; SUBSTRATES; SURFACE TOPOGRAPHY; THIN FILMS; WAVEGUIDES; YTTRIUM BARIUM COPPER OXIDES;

LASER SCANNING MICROSCOPES (LSM);

HIGH TEMPERATURE SUPERCONDUCTORS;

EID: 0037164837     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1530753     Document Type: Article

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