Local dielectric and strain measurements in YBa2Cu 3O7-δ thin films by evanescent microscopy and Raman spectroscopy

Superconductor Science and Technology

Volumn 18, Issue 9, 2005, Pages 1197-1203

  Kleismit, Richard A ^a,b   ElAshry, Mostafa ^a   Kozlowski, Gregory ^c   Amer, Maher S ^a   Kazimierczuk, Marian K ^a   Biggers, Rand R ^b  

^a Wright State University   (United States)

^b AIR FORCE RESEARCH LABORATORY   (United States)

^c WRIGHT STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DIELECTRIC MATERIALS; NATURAL FREQUENCIES; RAMAN SPECTROSCOPY; RESONANCE; STRAIN MEASUREMENT; SUPERCONDUCTING FILMS; YTTRIUM COMPOUNDS;

COAXIAL TRANSMISSION; FREQUENCY SHIFTS; LOCAL DIELECTRICS; RESONANCE FREQUENCY;

THIN FILMS;

EID: 23844504575     PISSN: 09532048     EISSN: None     Source Type: Journal    
DOI: 10.1088/0953-2048/18/9/009     Document Type: Article

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