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Volumn 292, Issue 1-2, 1997, Pages 133-139

Equivalence of LTSLM and LTSEM analyses: Study of a YBa2Cu3O7 multi-layer device

Author keywords

[No Author keywords available]

Indexed keywords

CRITICAL CURRENT DENSITY (SUPERCONDUCTIVITY); ELECTRIC PROPERTIES; LASER APPLICATIONS; LOW TEMPERATURE ENGINEERING; SCANNING ELECTRON MICROSCOPY; SUPERCONDUCTING DEVICES; SUPERCONDUCTING TRANSITION TEMPERATURE;

EID: 0031373205     PISSN: 09214534     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-4534(97)01649-3     Document Type: Article
Times cited : (6)

References (25)
  • 18
    • 30244563902 scopus 로고    scopus 로고
    • Ph.D. thesis, Shaker Verlag, Aachen
    • N. Dieckmann, Ph.D. thesis, Shaker Verlag, Aachen, 1997.
    • (1997)
    • Dieckmann, N.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.