Laser Seebeck Effect Imaging (SEI) and Peltier Effect Imaging (PEI): Complementary investigation methods

Microelectronics Reliability

Volumn 43, Issue 9-11, 2003, Pages 1609-1613

  Dilhaire, Stefan ^a   Salhi, Amine ^a   Grauby, Stéphane ^a   Claeys, Wilfrid ^a  

^a UNIVERSITÉ DE BORDEAUX   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC POTENTIAL; INTEGRATED CIRCUITS; LASER BEAMS; THERMOELECTRICITY;

SEEBECK EFFECT IMAGING (SEI);

IMAGING TECHNIQUES;

EID: 0042193245     PISSN: 00262714     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0026-2714(03)00282-8     Document Type: Conference Paper

References (8)

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2. th International Symposium for Testing and failure Analysis (2001), pp 43-57.
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