Spatially resolved characterization of superconducting films and cryoelectronic devices by means of low temperature scanning laser microscope

Applied Surface Science

Volumn 106, Issue , 1996, Pages 390-395

  Sivakov, A G ^a   Zhuravel', A P ^a   Turutanov, O G ^a   Dmitrenko, I M ^a  

^a B VERKIN INSTITUTE FOR LOW TEMPERATURE PHYSICS AND ENGINEERING   (Ukraine)

Author keywords

[No Author keywords available]

Indexed keywords

HIGH TEMPERATURE SUPERCONDUCTORS; JOSEPHSON JUNCTION DEVICES; POLYCRYSTALLINE MATERIALS; SUPERCONDUCTING FILMS;

PHASE SLIP LINES; RESISTIVE TRANSITION;

LASER APPLICATIONS;

EID: 0030566004     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(96)00445-X     Document Type: Article

References (4)

1. A. Frenkel, Phys. Rev. B 48 (1993) 9717.
2. R. Gross and D. Koelle, Preprint University of Tubingen (1993).
3. E.M.C.M. Reuvekarap, G.J. Gerritsma, D. Terpstra, M.A.J. Verhoeven, H. Rogalla, J.G. Wen and H.W. Zandbergen, in: Applied Superconductivity, Ed. H.C. Freyhardt, Proc. EUCAS, Göttingen, Germany, Vol. 2 (1993) p. 1231.
4. V.G. Volotskaya, I.M. Dmitrenko and A.G. Sivakov, Sov. J. Low Temp. Phys. 10 (1984) 179.