Diffraction-limited two-dimensional hard-x-ray focusing at the 100 nm level using a Kirkpatrick-Baez mirror arrangement

Review of Scientific Instruments

Volumn 76, Issue 8, 2005, Pages 1-5

  Matsuyama, S ^a   Mimura, H ^a   Yumoto, H ^a   Yamamura, K ^a   Sano, Y ^a   Endo, K ^a   Mori, Y ^a   Nishino, Y ^b   Tamasaku, K ^b   Ishikawa, T ^b   Yabashi, M ^c   Yamauchi, K ^a  

^a OSAKA UNIVERSITY   (Japan)

^b RIKEN   (Japan)

^c JAPAN SYNCHROTRON RADIATION RESEARCH INSTITUTE   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; ELECTROMAGNETIC WAVE REFLECTION; MIRRORS; X RAYS;

BEAM PROFILES; HARD-X-RAY FOCUSING; KIRKPATRICK-BAEZ MIRROR ARRANGEMENT; OPTICAL SIMULATIONS;

ELECTROMAGNETIC WAVE DIFFRACTION;

EID: 26444518782     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2005427     Document Type: Article

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