Deterministic retrieval of surface waviness by means of topography with coherent X-rays

Journal of Synchrotron Radiation

Volumn 9, Issue 4, 2002, Pages 223-228

  Souvorov, A ^a   Yabashi, M ^a   Tamasaku, K ^a   Ishikawa, T ^a   Mori, Y ^a   Yamauchi, K ^a   Yamamura, K ^a   Saito, A ^a  

^a JASRI ^*  (Japan)

Author keywords

Coherent X rays; Surface profiles; Topography

Indexed keywords

ARTICLE;

EID: 0036658350     PISSN: 09090495     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0909049502008804     Document Type: Article

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