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Volumn 6, Issue 5, 2006, Pages 930-936

Low-frequency current fluctuations in individual semiconducting single-wall carbon nanotubes

Author keywords

[No Author keywords available]

Indexed keywords

CURRENT FLUCTUATIONS; NOISE BEHAVIOR; NOISE LEVEL; SWITCHING MECHANISMS;

EID: 33744824406     PISSN: 15306984     EISSN: None     Source Type: Journal    
DOI: 10.1021/nl052528d     Document Type: Article
Times cited : (134)

References (40)
  • 12
  • 30
    • 33744783102 scopus 로고    scopus 로고
    • note
    • -).
  • 31
    • 33744793718 scopus 로고    scopus 로고
    • note
    • 40 With a gate voltage ∼1 V beyond the threshold voltage, the number of charges in the 600-nm channel is ∼150, which is in reasonable agreement (within a factor of 5) with the value obtained from numerical simulation.
  • 34
    • 33744787325 scopus 로고    scopus 로고
    • note
    • SB for the two devices.
  • 37
    • 33744783356 scopus 로고    scopus 로고
    • Balandin, A., Ed.; American Science Publishers: Stevenson Ranch, CA, Chapter 18
    • Mihaila, M. N. In Noise and Fluctuations Control in Electronic Devices; Balandin, A., Ed.; American Science Publishers: Stevenson Ranch, CA, 2002; Chapter 18, pp 366-385.
    • (2002) Noise and Fluctuations Control in Electronic Devices , pp. 366-385
    • Mihaila, M.N.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.