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Volumn 510, Issue 1-2, 2006, Pages 260-264

Polycrystalline growth and recrystallization processes in sputtered ITO thin films

Author keywords

Annealing; Indium tin oxide; Sputtering; Structural properties

Indexed keywords

CRYSTAL GROWTH; INDIUM COMPOUNDS; POLYCRYSTALLINE MATERIALS; SUBSTRATES; X RAY DIFFRACTION;

EID: 33646412593     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2005.12.273     Document Type: Article
Times cited : (84)

References (26)
  • 15
    • 33646392839 scopus 로고    scopus 로고
    • Powder Diffraction File, Joint Committee on Powder Diffraction Standards - International Centre for Diffraction Data, Pennsylvania, 1981, Card 06-0416.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.