A spectroscopic ellipsometry study on the variation of the optical constants of tin-doped indium oxide thin films during crystallization

Solid State Communications

Volumn 129, Issue 8, 2004, Pages 491-495

  Jung, Yeon Sik ^a,b  

^a Samsung Corning Co Ltd   (South Korea)

^b Korea Institute of Science and Technology   (South Korea)

Author keywords

A. Thin films; D. Optical properties; E. Light absorption and reflection

Indexed keywords

CRYSTALLIZATION; ELLIPSOMETRY; HALL EFFECT; HEAT TREATMENT; LIGHT ABSORPTION; LIGHT REFLECTION; SEMICONDUCTING INDIUM COMPOUNDS; SEMICONDUCTOR DOPING; SPECTROSCOPIC ANALYSIS; THIN FILMS; TIN;

FILM-SUBSTRATE INTERFACE; OPTICAL CONSTANTS;

SOLID STATE PHYSICS;

EID: 0346308508     PISSN: 00381098     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ssc.2003.11.044     Document Type: Article

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