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Volumn 460, Issue 1-2, 2004, Pages 315-323

The influence of film structure on In2O3 gas response

Author keywords

Deposition process; Indium oxide; Sensors; Structural properties

Indexed keywords

DEPOSITION; FILM GROWTH; GRAIN SIZE AND SHAPE; INDIUM COMPOUNDS; PYROLYSIS; SENSORS; SPRAY GUNS; STOICHIOMETRY; VACUUM;

EID: 2942568552     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2004.02.018     Document Type: Article
Times cited : (159)

References (29)
  • 5
    • 0031703283 scopus 로고    scopus 로고
    • Surface-controlled nanoscale materials for high-added-value applications
    • K.E. Gonsalves, M.-I. Baraton, R. Singh, H. Hofmann, J.X. Chen, J.A. Akkara (Eds.)
    • G.S.V. Coles, G. Williams, Surface-controlled nanoscale materials for high-added-value applications, In: K.E. Gonsalves, M.-I. Baraton, R. Singh, H. Hofmann, J.X. Chen, J.A. Akkara (Eds.), Materials Research Society Symposium Proceeding 501, (1998) 33.
    • (1998) Materials Research Society Symposium Proceeding , vol.501 , pp. 33
    • Coles, G.S.V.1    Williams, G.2
  • 22
    • 2942626483 scopus 로고    scopus 로고
    • Joint Committee on Powders Diffraction Standards. Card 6-416. JCPDS International Center for Diffraction Data. Swarthmore, USA
    • Joint Committee on Powders Diffraction Standards. Card 6-416. JCPDS International Center for Diffraction Data. Swarthmore, USA.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.