Annealing temperature dependence of EL properties of Si/β-FeSi2/Si(111) double-heterostructures light-emitting diodes

Thin Solid Films

Volumn 508, Issue 1-2, 2006, Pages 376-379

  Ugajin, Y ^a   Takauji, M ^a   Suemasu, T ^a  

^a UNIVERSITY OF TSUKUBA   (Japan)

Author keywords

FeSi2; Annealing; Double heterostructures; Electroluminescence

Indexed keywords

AGGLOMERATION; ANNEALING; ELECTROLUMINESCENCE; HETEROJUNCTIONS; MOLECULAR BEAM EPITAXY; THIN FILMS;

DOUBLE-HETEROSTRUCTURES; NONRADIATIVE RECOMBINATION CENTERS;

LIGHT EMITTING DIODES;

EID: 33646095201     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2005.07.342     Document Type: Article

References (26)

1. Leong D., Harry M., Reeson K.J., and Homewood K.P. Nature 387 (1997) 686
2. Suemasu T., Negishi Y., Takakura K., and Hasegawa F. Jpn. J. Appl. Phys. 39 (2000) L1013
3. Suemasu T., Negishi Y., Takakura K., Hasegawa F., and Chikyow T. Appl. Phys. Lett. 79 (2001) 1804
4. Lourenco M.A., Butler T.M., Kewell A.K., Gwilliam R.M., Kirkby K.J., and Homewood K.P. Jpn. J. Appl. Phys. 40 (2001) 4041
5. Martinelli L., Grilli E., Guzzi M., and Grimaldi M.G. Appl. Phys. Lett. 83 (2003) 794
6. Li C., Suemasu T., and Hasegawa F. J. Appl. Phys. 97 (2005) 043529
7. Sunohara T., Li C., Ozawa Y., Suemasu T., and Hasegawa F. Jpn. J. Appl. Phys. 44 (2005) 3951
8. Maeda Y., Terai Y., Itakura M., and Kuwano N. Thin Solid Films 461 (2004) 160
9. Terai Y., and Maeda Y. Appl. Phys. Lett. 84 (2004) 903
10. Suemasu T., Tanaka M., Fujii T., Hashimoto S., Kumagai Y., and Hasegawa F. Jpn. J. Appl. Phys. 36 (1997) L1225
11. Lin C., Wang L., Chen X., Chen L.F., and Wang L.M. Jpn. J. Appl. Phys. 37 (1998) 622
12. Koga T., Tatsuoka H., and Kuwabara H. Appl. Surf. Sci. 169-170 (2001) 310
13. Chu S., Hirohada T., Kan H., and Hiruma T. Jpn. J. Appl. Phys. 43 (2004) L154
14. Chu S., Hirohada T., and Kan H. Jpn. J. Appl. Phys. 41 (2002) L1200
15. Takauji M., Seki N., Suemasu T., Hasegawa F., and Ichida M. J. Appl. Phys. 96 (2004) 2561
16. Takauji M., Li C., Suemasu T., and Hasegawa F. Jpn. J. Appl. Phys. 44 (2005) 2483
17. Suemasu T., Iikura Y., Fujii T., Takakura K., Hiroi N., and Hasegawa F. Jpn. J. Appl. Phys. 38 (1999) L620
18. Hiroi N., Suemasu T., Takakura K., Seki N., and Hasegawa F. Jpn. J. Appl. Phys. 40 (2001) L1008
19. Kanaya H., Shigakawa H., Hasegawa F., and Yamaka E. Jpn. J. Appl. Phys. 29 (1990) L195
20. Saito T., Suemasu T., Yamaguchi K., Mizushima K., and Hasegawa F. Jpn. J. Appl. Phys. 43 (2004) L957
21. Fukatsu S., Usami N., and Shiraki Y. Jpn. J. Appl. Phys. 32 (1993) 1502
22. Mohring H.D., Weber J., and Sauer R. Phys. Rev., B 30 (1984) 894
23. Kuroda R., Tanoue H., Makita Y., Wang S., Fukuzawa Y., Otogawa N., and Nakayama Y. J. Appl. Phys. 95 (2004) 4019
24. Miki T., Matsui Y., Teraoka Y., Ebina Y., Matsubara K., and Kishimoto K. J. Appl. Phys. 76 (1994) 2097
25. Tani J., and Kido H. J. Alloys Compd. 352 (2003) 153
26. Takakura K., Suemasu T., Hiroi N., and Hasegawa F. Jpn. J. Appl. Phys. 39 (2000) L233