A simple method for evaluating flaw distributions responsible for size effects in the strength of small-scale silicon specimens

Key Engineering Materials

Volumn 312, Issue , 2006, Pages 77-82

  Duan, Kai ^a   Hu, Xiaozhi ^a  

^a UNIVERSITY OF WESTERN AUSTRALIA   (Australia)

Author keywords

Flaw size; Silicon; Small scale specimens; Strength; Weibull distribution

Indexed keywords

GRAIN SIZE AND SHAPE; PROBABILITY; SILICON; SINGLE CRYSTALS; STRENGTH OF MATERIALS; WEIBULL DISTRIBUTION;

FLAW SIZE; POWER-LAW DISTRIBUTION; SMALL-SCALE SPECIMENS; SYSTEMATIC TIGHTENING;

CRYSTAL DEFECTS;

EID: 33645735144     PISSN: 10139826     EISSN: 16629795     Source Type: Book Series    
DOI: 10.4028/0-87849-994-6.77     Document Type: Article

References (24)

1. C.J. Wilson, A. Ormeggi and M. Narbuto: J. Appl. Phys. Vol. 79 (1996), p. 2386.
2. S. Johansson, J.-A. Schweitz, L. Tenerz and J. Tirén: J. Appl. Phys. Vol. 63 (1988), p. 4799.
3. S. Greek, F. Ericson, S. Johansson and J.A. Schweitz: Thin Solid Films Vol. 292 (1997), p.247.
4. T. Tsuchiya, O. Tabata, J. Sakata and Y. Taga: J. Microelectromech. Sys. Vol. 7 (1998), p. 106.
5. S. Greek, F. Ericson, S. Johansson, M. Furtsch and A. Rump: J. Micromech. Microeng. Vol. 9 (1999) 245.
6. J. Kohler, K. Jonsson, S. Greek and L. Stenmark: J. Electrochem. Soc. Vol. 147 (2000), p.4683.
7. T. Namazu, Y. Isono and T. Tanaka: J. Microelectromech. Sys. Vol. 9 (2000), p. 450.
8. W.N. Sharpe, K.M. Jackson, K.J. Hemker and Z.L. Xie: J. Microelectromech. Sys. Vol. 10 (2001), p. 317.
9. J.N. Ding, Y.G. Meng and S.Z. Wen: J. Mater. Res. Vol. 16 (2001), p. 2223.
10. J.N. Ding, Y.G. Meng and S.Z. Wen: Mater. Sci. Eng. B Vol. 83 (2001), p. 42.
11. J.N. Ding, Y.C. Yang, L. Cai and S.Z. Wen: Int. J. Nonlinear Sci. Num. Simulation Vol. 3 (2002), p. 499.
12. S. Sundararajan and B. Bhushan: Sens. Actual. A Vol. 101 (2002), p. 338.
13. O.M. Jadaan, N.N. Nemeth, J. Bagdan and W.N. Sharpe: J. Mater. Sci. Vol. 38 (2003), p. 4087.
14. K.S. Chen and K.S. Ou: Sens. Actual. A Vol. 112 (2004), p. 163.
15. R. Ballarini, R.L. Mullen, Y. Yin, H. Kahn, S. Stemmer and A.H. Heuer: J. Mater. Res. Vol. 12 (1997), p. 915.
16. K. Duan and X.Z. Hu: presented to China Int. Conf. Nanosci. & Tech. (China NANO 2005), June 9-11, 2005, Beijing, China
17. B.R. Lawn: Fracture of Brittle Solids (Cambridge University Press, Cambridge, 1993), Ch. 9.
18. X. Hu, B. Cotterell and Y.-W. Mai: Proc. Roy. Soc. Lond. A Vol. 401 (1985), p. 251.
19. X. Hu, Y.-W. Mai and B. Cotterell: Philos. Mag. Vol. 58 (1988), p. 299.
20. X. Hu: Mater. Forum Vol. 16 (1992), p. 313.
21. B.R. Lawn and D.B. Marshall: J. Am. Ceram. Soc. Vol. 62 (1979), p. 347.
22. Y.-G. Jung, A. Pajares, R. Banerjee and B.R. Lawn, Acta Mater. Vol. 52 (2004), p. 3459.
23. B.R. Lawn: J. Mater. Res. Vol. 19 (2004), p. 22.
24. L.B. Freund and S. Suresh: Thin Film Materials: Stress, Defect Formation and Surface Evolution (Cambridge University Press, 2004).