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Volumn 112, Issue 1, 2004, Pages 163-174

Equivalent strengths for reliability assessment of MEMS structures

Author keywords

Failure probability; Fracture strength; MEMS; Weibull statistics

Indexed keywords

DATA REDUCTION; FABRICATION; FRACTURE TOUGHNESS; POLYSILICON; PROBABILITY; SCATTERING; STRUCTURAL DESIGN; WEIBULL DISTRIBUTION;

EID: 2142724765     PISSN: 09244247     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.sna.2003.12.011     Document Type: Article
Times cited : (17)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.