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Volumn 3, Issue 3-4, 2002, Pages 499-502

Surface Roughness Effect on the Tensile Strength of Micromachined Polysilicon Films

Author keywords

Fracture; Mechanical properties; Polysilicon; Surface roughness

Indexed keywords


EID: 0036323166     PISSN: 15651339     EISSN: None     Source Type: Journal    
DOI: 10.1515/IJNSNS.2002.3.3-4.499     Document Type: Article
Times cited : (7)

References (8)
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    • Wen, S.Z.1    Ding, J.N.2
  • 2
    • 0035436252 scopus 로고    scopus 로고
    • Size effect on the mechanical properties of microfabricated polysilicon thin films
    • Ding, J.N., Meng, Y.G., Wen, S.Z. Size effect on the mechanical properties of microfabricated polysilicon thin films, J.Mater. Res., 16(2001)2223 - 2228
    • (2001) J.Mater. Res. , vol.16 , pp. 2223-2228
    • Ding, J.N.1    Meng, Y.G.2    Wen, S.Z.3
  • 3
    • 0035927973 scopus 로고    scopus 로고
    • Specimen size effect on mechanical properties of polysilicon microcantilever beams by deflection using nanoindentation
    • Ding, J.N., Meng, Y.G., Wen, S.Z. Specimen size effect on mechanical properties of polysilicon microcantilever beams by deflection using nanoindentation, Materials Science and Engineering B, 83(2001)42 - 47
    • (2001) Materials Science and Engineering B , vol.83 , pp. 42-47
    • Ding, J.N.1    Meng, Y.G.2    Wen, S.Z.3
  • 4
    • 0032628017 scopus 로고    scopus 로고
    • Evaluation of mechanical materials properties by means of surface micromachined structures
    • Schweitz, J.Å., Ericson, F. Evaluation of mechanical materials properties by means of surface micromachined structures, Sensors and Actuators, A74(1999)126 - 133
    • (1999) Sensors and Actuators , vol.A74 , pp. 126-133
    • Schweitz, J.Å.1    Ericson, F.2
  • 5
    • 0032291865 scopus 로고    scopus 로고
    • The effects of post-deposition processes on polysilicon Young's modulus
    • Lee, S., Cho, C.H., Kim, J. The effects of post-deposition processes on polysilicon Young's modulus, J. Micromech. Microeng., 8(1998)330-337
    • (1998) J. Micromech. Microeng. , vol.8 , pp. 330-337
    • Lee, S.1    Cho, C.H.2    Kim, J.3
  • 6
    • 0033096744 scopus 로고    scopus 로고
    • Relating mechanical testing and microstructural features of polysilicon thin films
    • Jayaraman, S., Edwards, R.L., Hemker, K.J. Relating mechanical testing and microstructural features of polysilicon thin films, J. Mater. Res., 14(1999)688 - 697
    • (1999) J. Mater. Res. , vol.14 , pp. 688-697
    • Jayaraman, S.1    Edwards, R.L.2    Hemker, K.J.3
  • 7
    • 0027562279 scopus 로고
    • Microtensile testing of free-standing polysilicon fibers of various grain sizes
    • Koskinen, J., Steiwall, J.E., Soave, R., Johnson, H.H. Microtensile testing of free-standing polysilicon fibers of various grain sizes, J. Micromech. Microeng., 3(1993)13 -17
    • (1993) J. Micromech. Microeng. , vol.3 , pp. 13-17
    • Koskinen, J.1    Steiwall, J.E.2    Soave, R.3    Johnson, H.H.4
  • 8
    • 0030246332 scopus 로고    scopus 로고
    • Fracture testing of bulk silicon microcantilever beams subjected to a side load
    • Wilson, C.J., Beck, P.A. Fracture testing of bulk silicon microcantilever beams subjected to a side load, Journal of microelectromechanical systems, 5(1996)142 - 150
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    • Wilson, C.J.1    Beck, P.A.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.